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X-ray fluorescence analysis of environmental samples

Dzubay, Thomas G.. Ann Arbor, Mich.: Ann Arbor Science Publishers, 1977.
QD 96 X2 X2 (Catalogue)

Handbook of x-ray and ultraviolet photoelectron spectroscopy

Briggs, D. (David), 1948-. London: Heyden, 1977.
QC 454 P48 H3 (Catalogue)

X-ray spectrometry

Herglotz, Heribert.; Birks, L. S.. New York: M. Dekker, 1978.
QC 482 S6 X18 (Catalogue)

Electron beam x-ray microanalysis

Heinrich, Kurt F. J.. New York: Van Nostrand Reinhold Co., 1981.
QD 98 E4 H44 (Catalogue)

Quantitative x-ray spectrometry

Jenkins, Ron, 1932-; Gould, Robert William; Gedcke, Dale, 1939-. New York: M. Dekker, 1981.
QD 96 X2 J46 (Catalogue)

Elemental X-ray analysis of materials : EXAM : principles and practical experiments

Russ, John C.; Shen, Robert; Jenkins, Ron, 1932-. Prairie View, Ill.: Edax International Inc., 1978.
QC 482 S6 R8 (Catalogue)

[Proceedings of the twenty-fifth annual Conference on Applications of|X-Ray Analysis, held in Denver, August 4-6, 1976]

McMurdie, Howard F.; University of Denver. Dept. of Chemistry; Denver Research Institute. Metallurgy and Materials Science Division. New York ; London: Plenum Press, 1977.
QC 480.8 C6 1976 (Catalogue)

Elemental X-ray analysis of materials : EXAM methods

Russ, John C.; Walsh, Charles J. Raleigh, N.C.: EDAX Laboratories Division EDAX International Inc., 1972.
QC 482 S6 R88 (Catalogue)

Advances in x-ray analysis :Proceedings

Denver Research Institute. New York: Plenum, 1972.
QC 480.8 C6 1971 (Catalogue)

Introduction to X-ray spectrometric analysis

Bertin, Eugene P., 1921-. New York: Plenum Press, 1978.
QD 96 X2 B46 (Catalogue)

Principles and practice of X-ray spectrometric analysis

Bertin, Eugene P., 1921-. New York: Plenum Press, 1975.
QD 96 .X2 .B47 1975 (Catalogue)

A simple correction procedure for quantitative electron probe microanalysis

Heinrich, Kurt F. J.; United States. National Bureau of Standards. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards, 1972.
QD 98 E4 H45 (Catalogue)

X-ray spectrochemical analysis

Birks, L. S.. New York: Interscience Publishers, 1969.
QD 95 B5 1969 (Catalogue)

An introduction to X-ray spectrometry

Jenkins, Ron, 1932-. London ; New York: Heyden, 1974.
QD 95 J4 1974 (Catalogue)

Chemical analysis of prehistoric human bone from five temporally distinct populations in Southern Ontario

Katzenberg, Mary Anne. Ottawa, ON: National Museums of Canada, 1984.
CC 79.5 H8 K38 (Catalogue)

X-ray fluorescence spectra of artist's pigments used for paintings

Kennedy, P. L.; Atomic Energy of Canada Limited. Commercial Products; National Conservation Research Laboratory; National Gallery of Canada. Ottawa: Atomic Energy of Canada National Gallery of Canada National Conservation Research Laboratory, 1970.
TP 936.5 K4 1970 (Catalogue)

All you ever wanted to know about x-ray energy spectrometry

Woldseth, Rolf. Burlingame, Calif.: Kevex Corporation, 1973.
QC 482 S6 W65 (Catalogue)

The development of potential thin standards for calibration of x-ray fluorescence sepectrometry : interagency energy / environment R & D program report

Pella, P.A.. Washington, D.C.: National Bureau of Standards, 1980.
QD 96 X2 P44 (Catalogue)

Special Millennium issue on cultural heritage

New York: Wiley, 2000.
QC 482 S6 X62 (Catalogue)

Introduction to imaging spectrometers / William L. Wolfe

Wolfe, William L.. Bellingham, WA: SPIE, 1997.
QC 373 S7 W65 (Catalogue)

Advances in X-ray analysis, volume 47 [CD-ROM] : proceedings of the 52nd Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference) 4-8 August 2003, Denver, Colorado, U.S.A.

Huang, Ting C.. Newtown Square, Pa: International Centre for Diffraction Data, 2004.
QC 480.8 C6 (Catalogue)

The application of x-ray fluorescence spectrometry to the study of museum objects : academisch proefschrift

Glinsman, Lisha Deming. New York: s.n., 2004.
QD 96 F56 G55 (Catalogue)

Advances in x-ray analysis, volume 31 : [proceedings of the 31st Conference on Applications of X-Ray Analysis, held August 3-7, 1987, in Denver, Colorado]

University of Denver. Dept. of Engineering; Barrett, C. S. (Charles Sanborn). New York: Plenum, 1988.
QC 480.8 C6 1987 (Catalogue)

Advances in X-ray analysis, volume 48 [CD-ROM] : proceedings of the 53rd Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference) 2-6 August 2004, Steamboat Springs, Colorado, U.S.A.

Huang, Ting C.. Newtown Square, Pa: International Centre for Diffraction Data, 2005.
QC 480.8 C6 (Catalogue)

Advances in X-ray analysis, volume 49 [CD-ROM] : proceedings of the 54th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference) 1-5 August 2005, Colorado Springs, Colorado, U.S.A.

Anzelmo, John A.. Newtown Square, Pa: International Centre for Diffraction Data, 2006.
QC 480.8 C6 (Catalogue)

Type de document

Monograph = Monographie (25)
CD-ROM (7)
Online resource = Ressource en ligne (1)
Special issue (Serial) = Numéro spécial (Publ. en série) (1)

Auteur ou éditeur

Huang, Ting C. (5)
Jenkins, Ron, 1932- (3)
Bertin, Eugene P., 1921- (2)
Birks, L. S. (2)
Heinrich, Kurt F. J. (2)
Russ, John C. (2)
Anzelmo, John A. (1)
Atomic Energy of Canada Limited. Commercial Products (1)
Barrett, C. S. (Charles Sanborn) (1)
Beckhoff, B. (Burnhard) (1)
Briggs, D. (David), 1948- (1)
Denver Research Institute (1)
Denver Research Institute. Metallurgy and Materials Science Division (1)
Drake, B. Lee (1)
Dzubay, Thomas G. (1)
Gedcke, Dale, 1939- (1)
Glinsman, Lisha Deming (1)
Gould, Robert William (1)
Haschke, Michael, 1948- (1)
Herglotz, Heribert. (1)
Katzenberg, Mary Anne (1)
Kennedy, P. L. (1)
MacDonald, Brandi L. (1)
McMurdie, Howard F. (1)
National Conservation Research Laboratory (1)
National Gallery of Canada (1)
Pella, P.A. (1)
Potts, Philip J. (1)
Royal Society of Chemistry (Great Britain) (1)
Shen, Robert (1)
United States. National Bureau of Standards (1)
University of Denver. Dept. of Chemistry (1)
University of Denver. Dept. of Engineering (1)
Walsh, Charles J (1)
West, Margaret (1)
Woldseth, Rolf (1)
Wolfe, William L. (1)

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Date de modification :: 2019-03-01