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Electron beam x-ray microanalysis
Heinrich, Kurt F. J.. [New York]: Van Nostrand Reinhold Co., 1981.QD 98 E4 H44 (Catalogue)
A simple correction procedure for quantitative electron probe microanalysis
Heinrich, Kurt F. J.; United States. National Bureau of Standards. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards, 1972.QD 98 E4 H45 (Catalogue)
Electron beam microanalysis
Beaman, Donald Robert; Isasi, J. A.. Philadelphia: American Society for Testing and Materials, 1972.QD 98 E4 B4 1972 (Catalogue)
A manual of quantitative electron probe microanalysis
Salter, William John Malcolm. London: Structural Publications Ltd., 1970.QD 98 E4 S3 1970 (Catalogue)
Advanced scanning electron microscopy and X-ray microanalysis
Newbury, Dale E.. [New York]: Plenum Press, 1986.QH 212 S3 A38 (Catalogue)
Electron probe quantitation
Heinrich, Kurt F. J., ed.; Newbury, Dale E., ed.. [New York]: Plenum Press, 1991.QD 98 E4 E44 (Catalogue)
A rigorous correction procedure for quantitative electron probe microanalysis (COR 2)
Henoc, Jean; United States. Dept. of Commerce. National Bureau of Standards. Washington, D.C.: Dept. of Commerce, National Bureau of Standards, 1973.QD 98 E4 H38 (Catalogue)
Auteur ou éditeur
Heinrich, Kurt F. J.
(2)
Beaman, Donald Robert (1)
Heinrich, Kurt F. J., ed. (1)
Henoc, Jean (1)
Isasi, J. A. (1)
Newbury, Dale E. (1)
Newbury, Dale E., ed. (1)
Salter, William John Malcolm (1)
United States. Dept. of Commerce. National Bureau of Standards (1)
United States. National Bureau of Standards (1)
Beaman, Donald Robert (1)
Heinrich, Kurt F. J., ed. (1)
Henoc, Jean (1)
Isasi, J. A. (1)
Newbury, Dale E. (1)
Newbury, Dale E., ed. (1)
Salter, William John Malcolm (1)
United States. Dept. of Commerce. National Bureau of Standards (1)
United States. National Bureau of Standards (1)